The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Aug. 23, 2005
Applicants:

Erick Van Den Berg, Hoboken, NJ (US);

Sunil Madhani, Austin, TX (US);

Tao Zhang, Fort Lee, NJ (US);

Inventors:

Erick van den Berg, Hoboken, NJ (US);

Sunil Madhani, Austin, TX (US);

Tao Zhang, Fort Lee, NJ (US);

Assignees:

Toshiba America Reseach, Inc., Piscataway, NJ (US);

Telcordia Technologies, Inc., Piscataway, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04W 4/00 (2009.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
Abstract

In some embodiments, a system and method for substantially real-time comparison of quality of interfaces by mobile devices over heterogeneous networks is disclosed. The method can be performed using a dynamic and rapid comparison by distributed hosts, using a minimal number of injected network packets, using minimal path quality metrics, which path quality metrics are independent of how a QoI is measured, and in a manner suitable for both wireline and wireless networks.


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