The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Jan. 20, 2006
Vivek Srinivasan, Cambridge, MA (US);
James Fujimoto, Medford, MA (US);
Tony Ko, San Jose, CA (US);
Maciej Wojtkowski, Cambridge, MA (US);
Robert Huber, Cambridge, MA (US);
Vivek Srinivasan, Cambridge, MA (US);
James Fujimoto, Medford, MA (US);
Tony Ko, San Jose, CA (US);
Maciej Wojtkowski, Cambridge, MA (US);
Robert Huber, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
In one aspect, the invention relates to a method of acquiring optical coherence tomographic data from a sample. The method includes the steps of scanning a first location on the sample to obtain a first set of optical coherence tomographic data, scanning a second location on the sample to obtain a second set of optical coherence tomographic data, and defining a fiducial position relative to a location on the sample using one of the two sets of optical coherence tomographic data. In one embodiment, the first set of optical coherence tomographic data is survey data. However, in another embodiment the first set of optical coherence tomographic data is sample measurement data.