The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Sep. 03, 2008
Peter Ehbets, Zurich, CH;
Peter Ehbets, Zurich, CH;
X-Rite Europe GmbH, Regensdorf, CH;
Abstract
A measuring system for photoelectrically scanning measurement points of a measurement object includes a lighting channel (-) for applying illuminating light to the measurement object (M) disposed in a measurement plane (MP) and a measuring channel (-) for capturing and photoelectrically converting the measurement light reflected by the measurement points of the measurement object M. The lighting channel and/or the measuring channel is configured so as to detect the reflection properties of the measurement points in several wavelength bands. The lighting channel (-) has a spatial light modulator controlled by an electronic control unit () for generating a spatial lighting pattern which causes illuminating light to be selectively applied to measurements points () of interest of the measurement object (M). The control unit () may be equipped with image processing functions and be configured to identify measurement points () suitable for the application purpose from image data of the measurement object (M) and to calculate corresponding lighting patterns for selectively illuminating the measurement points.