The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Dec. 02, 2008
Kaoru Kumagai, Itabashi-ku, JP;
Kenichiro Yoshino, Itabashi-ku, JP;
Yasushi Tanaka, Itabashi-ku, JP;
Ikuo Ishinabe, Itabashi-ku, JP;
Kaoru Kumagai, Itabashi-ku, JP;
Kenichiro Yoshino, Itabashi-ku, JP;
Yasushi Tanaka, Itabashi-ku, JP;
Ikuo Ishinabe, Itabashi-ku, JP;
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
A laser surveying system, comprising a light source for emitting a laser beam, a projection optical system for turning the laser beam from the light source to a parallel luminous flux, a scanning unit for projecting the luminous flux of the projected laser beam for scanning, a scanning direction detecting unit for detecting a scanning direction, a photodetection optical system for receiving a reflected light of the projected laser beam from an object to be measured, a photodetection element for performing photo-electric conversion of the reflected light received via the photodetection optical system, and a distance measuring unit for measuring a distance based on a signal from the photodetection element, wherein the projection optical system has a luminous flux diameter changing means, and a luminous flux diameter of the projected laser beam is enabled to be changed.