The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Mar. 06, 2009
Applicants:

Kazuya Shimizu, Kiryu, JP;

Masato Kaneta, Takasaki, JP;

Haruo Kobayashi, Kiryu, JP;

Tatsuji Matsuura, Tokyo, JP;

Katsuyoshi Yagi, Sagamihara, JP;

Akira Abe, Sapporo, JP;

Koichiro Mashiko, Takarazuka, JP;

Inventors:

Kazuya Shimizu, Kiryu, JP;

Masato Kaneta, Takasaki, JP;

Haruo Kobayashi, Kiryu, JP;

Tatsuji Matsuura, Tokyo, JP;

Katsuyoshi Yagi, Sagamihara, JP;

Akira Abe, Sapporo, JP;

Koichiro Mashiko, Takarazuka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A TDC circuit having a small scale circuit and high resolution is disclosed, which is a time-to-digital converter that detects a phase with respect to a reference clock of a signal to be measured, comprising a first delay line in which a plurality of first delay elements with a first delay amount is connected in series, a second delay line group that is connected to a plurality of connection nodes of the first delay line or an input node in the first stage and in which at least one or more second delay elements with a second delay amount different from the first delay amount are connected in series, a plurality of judgment circuits that judge whether the changing edge of the signal to be measured is advanced or delayed with respect to the changing edges of a delayed clock output from the first delay element and the second delay element, and an operation circuit that calculates a phase with respect to the reference clock of the changing edge of the signal to be measured from the judgment results, wherein a difference between the first delay amount and the second delay amount is smaller than the first delay amount and the second delay amount.


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