The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Aug. 30, 2007
Applicants:

Yong Wang, Shanghai, CN;

Yinhong Yang, Shanghai, CN;

Inventors:

Yong Wang, Shanghai, CN;

Yinhong Yang, Shanghai, CN;

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a clamp jaw assembly for a clamp meter is provided. The method includes providing a clamp jaw core and a shield having a channel. The method further includes positioning the clamp jaw core within the channel of the shield such that the shield surrounds a portion of the clamp jaw core. The method also includes enclosing the clamp jaw core and the shield within a clamp jaw housing.


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