The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Apr. 25, 2007
Yoshinobu Hosoi, Gamagori, JP;
Yuichiro Kanazawa, Okazaki, JP;
Hirohisa Terabe, Toyokawa, JP;
Yoshihiro Ozaki, Gamagori, JP;
Yoshinobu Hosoi, Gamagori, JP;
Yuichiro Kanazawa, Okazaki, JP;
Hirohisa Terabe, Toyokawa, JP;
Yoshihiro Ozaki, Gamagori, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
A subjective vision testing system is used for visual function tests for examinees. The subjective vision testing system is provided with an optometric apparatus which selectively sets optical elements in front of both eyes of an examinee, an optotype presenting apparatus for displaying optotypes to the examinee, and a controller. The optotype presenting apparatus, based on a command signal for implementation of a binocular balance test, displays optotypes used for binocular balance tests. The optometric apparatus, based on a command signal for implementation of a binocular balance test, sets a first prism in front of the examinee's right eye and a second prism in front of the examinee's left eye. The second prism has a base direction vertically opposite to the first prism and the same prism power as the first prism.