The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7882747 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 08, 2011

Filed:

Dec. 20, 2005
Applicants:

Keiichi Nakao, Osaka, JP;

Yukio Mizukami, Fukui, JP;

Hiroaki Ishida, Fukui, JP;

Koichi Aburata, Fukui, JP;

Inventors:

Keiichi Nakao, Osaka, JP;

Yukio Mizukami, Fukui, JP;

Hiroaki Ishida, Fukui, JP;

Koichi Aburata, Fukui, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention presents a strain sensor includes a substrate, a crystallized glass laminated on the substrate, a strain sensitive resistor laminated on the crystallized glass, in which the crystallized glass is formed by baking a plurality of types of crystallized glass powder having different thermomechanical constants. As a result, the fluctuation of sensor characteristic is decreased, and the cost is lowered.


Find Patent Forward Citations

Nakao, Keiichi. (2011). Strain sensor and method for manufacture thereof (U.S. Patent No. 7882747). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7882747

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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