The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2011

Filed:

Jun. 14, 2007
Applicants:

Nikolai Tillmann, Redmond, WA (US);

Jonathan Paul DE Halleux, Seattle, WA (US);

Wolfram Schulte, Bellevue, WA (US);

Inventors:

Nikolai Tillmann, Redmond, WA (US);

Jonathan Paul de Halleux, Seattle, WA (US);

Wolfram Schulte, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a computer system determines that a previously run test scenario configured to test a software program has failed to produce an expected result due to one or more semantic errors, generates error trace code configured to monitor the called component, processes the test scenario using the error trace code, and analyzes error trace information to determine the point at which the semantic error occurs in the called component. In an alternative embodiment, a computer system detects a semantic error in a software component of a software program, constructs an error condition that may include source code representing a minimum condition under which the error occurs, generates an object invariant based on the error condition that represents an opposite condition to that represented by the error condition, and automatically generates source code change recommendations using the object invariant that prevent the semantic error from reoccurring in subsequent test scenarios.


Find Patent Forward Citations

Loading…