The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Jun. 18, 2008
Yoichiro Ishikawa, Kawasaki, JP;
Yoichiro Ishikawa, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
There is provided a technique in which internal wires of a large cell are spuriously patterned and treated as object of a noise check. Internal wires of a large cell are spuriously determined based on terminal information and wiring forbidden information of the large cell and are added to chip wires to be checked, from which an object wire to be checked and at least one affecting wire are selected, a noise value representing a degree at which the at least one affecting wire induces noise onto the signal of the object wire is calculated and the noise check is performed on the basis of the calculated noise check.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile