The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Jun. 21, 2007
John Richard Houlihan, Round Rock, TX (US);
Dilton Monroe Mcgowan, Ii, Round Rock, TX (US);
John Richard Houlihan, Round Rock, TX (US);
Dilton Monroe McGowan, II, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A generic algorithm for analysis of resource metrics. A threshold is calculated in a stack tier policy for the performance state of a metric in a virtualized process collection (VPC). Responsive to determining that the metric is a critical metric, a weighted average of all metrics in the VPC is determined. Responsive to determining that the weighted average exceeds the threshold in the stack tier policy, if the value of the metric is determined to be higher than values for all recorded metrics, the value of the metric is stored as a highest value. A weighted average performance state of all metrics is calculated as the weight property of the performance metric divided by the weight factor total. Responsive to determining that the highest value is higher than the weighted average performance state of all metrics, the highest value is used as the performance state of the VPC.