The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Jan. 14, 2008
Donald F. Box, Bellevue, WA (US);
Brian F. Chapman, Redmond, WA (US);
Martin J. Gudgin, Sammamish, WA (US);
Michael J. Hillberg, Beaux Arts, WA (US);
Charles P. Jazdzewski, Redmond, WA (US);
Natasha H. Jethanandani, Seattle, WA (US);
Geoffrey M. Kizer, Seattle, WA (US);
Robert A. Relyea, Bellevue, WA (US);
Jeffrey C. Schlimmer, Redmond, WA (US);
Joel West, Seattle, WA (US);
Donald F. Box, Bellevue, WA (US);
Brian F. Chapman, Redmond, WA (US);
Martin J. Gudgin, Sammamish, WA (US);
Michael J. Hillberg, Beaux Arts, WA (US);
Charles P. Jazdzewski, Redmond, WA (US);
Natasha H. Jethanandani, Seattle, WA (US);
Geoffrey M. Kizer, Seattle, WA (US);
Robert A. Relyea, Bellevue, WA (US);
Jeffrey C. Schlimmer, Redmond, WA (US);
Joel West, Seattle, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Determining compatibility of data structures. A method may be practiced in a computing environment. The method includes accessing a first type defined in a mark-up object. The first type includes a first structure including a first plurality of fields. A second type defined in a mark-up object is accessed. The second type includes a second structure including a second plurality of fields. The first structure and the second structure are compared. Based on the comparison, a determination is made that the first type is compatible with the second type.