The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2011

Filed:

Feb. 06, 2006
Applicants:

Youqi Wang, Atherton, CA (US);

Marco Falcioni, San Francisco, CA (US);

Stephen J. Turner, Cupertino, CA (US);

C. Eric Ramberg, San Jose, CA (US);

Inventors:

Youqi Wang, Atherton, CA (US);

Marco Falcioni, San Francisco, CA (US);

Stephen J. Turner, Cupertino, CA (US);

C. Eric Ramberg, San Jose, CA (US);

Assignee:

FreeSlate, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Computer-implemented methods, systems and apparatus, including computer program apparatus, provide techniques for designing a set of experiments to be performed with a set of resources. A plurality of experimental configurations are generated based on a set of parameters describing factors to be varied in the experiments and a set of constraints representing limitations on operations that can be performed with the set of resources. A set of experiments is defined based on a selected configuration. The constraints can be represented as patterns defining an application of a parameter to a set of one or more points of an experimental lattice.


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