The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
May. 05, 2009
Shamus Mcdonnell, Edmonton, CA;
Mike Westman, Edmonton, CA;
Chijioke Ukiwe, Edmonton, CA;
Spectrum External Line Inspection Technology Inc., Edmonton, CA;
Abstract
A method of prioritizing anomalies in a linear conductor buried under a ground surface includes the steps of obtaining prioritization values for a plurality of anomalies along a linear conductor, and ranking the prioritization values according to magnitude. For each anomaly, a prioritization value is obtained by: locating an anomaly; for each anomaly, determining a current, a depth of cover, and a voltage gradient using spaced voltage probes; using the depth of cover and the voltage gradient, calculating an effective probe spacing of the first and second voltage probes relative to the anomaly on the conductor; and determining the prioritization value of the anomaly based on a linear relationship between the voltage gradient and the product of the current and the effective probe spacing.