The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Jan. 11, 2006
Frederic Dubois, Antony, FR;
Michael Bray, Paris, FR;
Frederic Dubois, Antony, FR;
Michael Bray, Paris, FR;
Essilor International (Compagnie Generale d'Optique), Charenton-le-Pont, FR;
MB Optique, Paris, FR;
Abstract
The probe comprises a light source (), means for shaping () the beam emitted by said light source and the beam coming from a surface arranged close to a target distance, an optical detector unit (), comprising a pinhole diaphragm () and a photoelectric detector (), providing a voltage peak () when said surface is at said target distance and further comprising a diaphragm () with a hole larger than said pinhole and a photoelectric detector (), providing a voltage greater than that produced by said detection sensor (), except when said surface is a the target distance. The method uses the probe to measure the thickness of an optical lens.