The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Jun. 29, 2009
Masahiro Toida, Kanagawa, JP;
Masahiro Toida, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
In an optical tomographic imaging apparatus, a wavelength of a light beam emitted from the light source is selected by a light source section filter, and the light beam emitted from the light source is split into a measurement light beam and a reference light beam. The measurement light beam is reflected from a measurement subject when the measurement light beam is irradiated, is amplified. A specific wavelength from the amplified reflected light beam is selected by an amplifying section filtering mechanism having a filter characteristic identical to a time variation characteristic of the light source section filter, and then the reflected light beam is multiplexed with the reference light beam. A tomographic image of the measurement subject is acquired from detection result of an interference light beam between the reflected light beam and the reference light beam which have been multiplexed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile