The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Mar. 02, 2009
Kazunori Bannai, Kanagawa-Ken, JP;
Daisuke Imaki, Kanagawa-Ken, JP;
Kazunori Bannai, Kanagawa-Ken, JP;
Daisuke Imaki, Kanagawa-Ken, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A first beam separation device is arranged either to allow the light beams to enter and pass or to reflect the light beams in accordance with a direction of entrance of the light beams. A second beam separation device is provided either to allow or to reflect the light beams having passed through the first beam separation device in accordance a wavelength thereof. The light beam passing through the second beam separation device scans one of plural scan objectives and the light beam reflected by the second beam separation device is further reflected by the first beam separation device and then scans the other one of the plural scan objectives. A first imaging device is provided to correct a f-theta (fθ) performance and a curvature of an imaging plane to enable the light beams to scan the plural scan objectives at a constant speed. The first imaging device is integral with the first beam separation device.