The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2011

Filed:

Jun. 16, 2008
Applicants:

Wladimiro Villarroel, Ypsilanti, MI (US);

Argy Petros, Parkland, FL (US);

Inventors:

Wladimiro Villarroel, Ypsilanti, MI (US);

Argy Petros, Parkland, FL (US);

Assignee:

AGC Automotive, Ypsilanti, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A signal measurement system tests an RF component in an RF test facility, such as an RF anechoic chamber. The system includes a repeater which is connected to an exterior antenna disposed outside the chamber and a transmitting antenna disposed inside the chamber. The repeater receives the RF broadcast signal from the exterior antenna and rebroadcasts it as an RF testing signal inside the chamber. The subject antenna receives the RF testing signal, which is then analyzed with a computer. The repeater may also modify the RF testing signal to produce a wide variety of test situations that mimic those available in a traditional field-test.


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Villarroel, Wladimiro. (2011). Signal measurement system and method for testing an rf component (U.S. Patent No. 7880670). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7880670

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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