The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2011
Filed:
Sep. 25, 2009
Applicants:
Kun-up Kim, Gyeonggi-do, KR;
Chang-sik Kim, Gyeonggi-do, KR;
Tae-sik Son, Gyeonggi-do, KR;
Doo-seon Lee, Gyeonggi-do, KR;
Inventors:
Kun-Up Kim, Gyeonggi-do, KR;
Chang-Sik Kim, Gyeonggi-do, KR;
Tae-Sik Son, Gyeonggi-do, KR;
Doo-Seon Lee, Gyeonggi-do, KR;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
In an embodiment, a semiconductor device is tested using a probe pad that includes a probing region with which a probe needle makes contact, and a sensing region bordering an edge of the probing region. Electrical signals are applied, and measured results indicate the probe needle's location relative to a test position on the semiconductor device.