The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2011

Filed:

Oct. 06, 2006
Applicants:

Tianwei Jing, Tempe, AZ (US);

Feimeng Zhou, Temple City, CA (US);

Nongjian Tao, Scottsdale, AZ (US);

Inventors:

Tianwei Jing, Tempe, AZ (US);

Feimeng Zhou, Temple City, CA (US);

Nongjian Tao, Scottsdale, AZ (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for detecting one or more substances includes a radiation source emitting a beam of radiation and also includes a material capable of reflecting the beam of radiation with a first characteristic and capable of reflecting the beam of radiation with a second characteristic when the material interacts with the one or more substances. The apparatus also includes two or more radiation detectors to detect the first and second characteristics of the beam of radiation. A first one of the two or more radiation detectors is adjustably aligned to detect the first and second characteristics of the beam of radiation reflected from a first region of the material. A second one of the two or more radiation detectors is adjustably aligned to detect the first and second characteristics of the beam of radiation reflected from a second region of the material.


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