The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Sep. 14, 2007
Thuyen Le, Taufkirchen, DE;
Thomas Pflueger, Leinfelden, DE;
Martin Padeffke, Hildrizhausen, DE;
Stefan Bonsels, Stuttgart, DE;
Thuyen Le, Taufkirchen, DE;
Thomas Pflueger, Leinfelden, DE;
Martin Padeffke, Hildrizhausen, DE;
Stefan Bonsels, Stuttgart, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.