The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7877638 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 25, 2011

Filed:

Sep. 05, 2008
Applicants:

Li-ping Fan, Shenzhen, CN;

Hong-lang LU, Shenzhen, CN;

Yu-lin Liu, Shenzhen, CN;

Inventors:

Li-Ping Fan, Shenzhen, CN;

Hong-Lang Lu, Shenzhen, CN;

Yu-Lin Liu, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for testing a computer includes a control module having a power cycling test program and a display driving program therein, a switch module connected to the control module for receiving trigger signals generated from the power cycling test program and powering on or off the computer consequently, a driving module connected to the control module for receiving display driving signals from the display driving program, and a display module connected to the driving module for displaying test parameters. A method utilizing above described apparatus for testing the computer is also disclosed.


Find Patent Forward Citations

Fan, Li-Ping. (2011). Apparatus and method for testing computer (U.S. Patent No. 7877638). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7877638

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