The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Aug. 28, 2008
Applicants:

Kyusung Kim, Plymouth, MN (US);

Robert C. Mccroskey, Burnsville, MN (US);

Paul Frederick Dietrich, Brooklyn Park, MN (US);

Inventors:

Kyusung Kim, Plymouth, MN (US);

Robert C. McCroskey, Burnsville, MN (US);

Paul Frederick Dietrich, Brooklyn Park, MN (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems are provided for detecting temporal relationships that are uniquely associated with a selected root cause. The method comprises identifying error codes associated with a root cause, wherein each error code comprises a plurality of event indicators and temporal data describing when the event indicator was generated, analyzing each of the error codes to detect a combination of event indicators that is associated with error codes corresponding to the selected root cause and to a non-selected root cause, and detecting a temporal relationship involving the combination of event indicators, wherein the temporal relationship is uniquely associated with error codes corresponding to the selected root cause.


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