The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Jan. 25, 2008
Applicant:

Andreas Sedlmayr, Friedberg, DE;

Inventor:

Andreas Sedlmayr, Friedberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for determining measurement points on a physical object, a number of measurement points are first selected in a graphical computer model of the object, until a sufficient number of measuring points have been selected so as to allow the position and orientation (lay) of the object to be determined relative to a reference system. A further measuring point of the object is then selected in the graphical computer model, and a check is automatically made to determine whether the further measuring point can determine the lay of the object relative to the reference coordinate system more accurately. If so, the further measuring point is used for this determination. Further measuring points are selected and checked in this manner, until the lay of the object can be determined better than with a predefined tolerance.


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