The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Jul. 13, 2008
Applicants:

Shen-chun LI, Taipei Hsien, TW;

Shou-kuo Hsu, Taipei Hsien, TW;

Wei-yuan Chen, Taipei Hsien, TW;

Cho-hao Wang, Taipei Hsien, TW;

Kuan-lin Wu, Taipei Hsien, TW;

Hung Chao, Taipei Hsien, TW;

Inventors:

Shen-Chun Li, Taipei Hsien, TW;

Shou-Kuo Hsu, Taipei Hsien, TW;

Wei-Yuan Chen, Taipei Hsien, TW;

Cho-Hao Wang, Taipei Hsien, TW;

Kuan-Lin Wu, Taipei Hsien, TW;

Hung Chao, Taipei Hsien, TW;

Assignee:

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for analyzing non-monotonic of signals is provided. The system is configured for receiving a signal and displaying changes of the signal using a waveform curve. The system is configured for analyzing data of the signals and the waveform curve in order to locate peak points on the waveform curve. The system is also configured for storing the signal data and data generated during the analyzing process. A related method is also provided.


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