The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Feb. 21, 2008
Applicants:

Fumio Futami, Kawasaki, JP;

Shigeki Watanabe, Kawasaki, JP;

Inventors:

Fumio Futami, Kawasaki, JP;

Shigeki Watanabe, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an optical waveform measurement system, a phase comparator compares phases between an electric signal output from a PD and an electric signal output from a mixer, and outputs a signal having an amplitude proportional to the phase difference of the two electric signals to a VCO via an LPF, as an error signal. A BPF removes a jitter from the electric signal output from the VCO, and a sampling pulse light source outputs sampling light based on the electric signal with the jitter removed. An optical sampling gate samples signal light to be measured with sampling light output from a sampling pulse light source, and the sampled signal light to be measured is measured by an oscilloscope.


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