The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Dec. 20, 2007
Applicants:

Ding Wang, Austin, TX (US);

Steven Y. Yu, Austin, TX (US);

Gary A. Shreve, Austin, TX (US);

Inventors:

Ding Wang, Austin, TX (US);

Steven Y. Yu, Austin, TX (US);

Gary A. Shreve, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system of measuring the spectroscopic impedance of a sensor and its immediate surroundings. The sensor is disposed on an engineered structure and is coated with a protective coating. The method includes providing a first optical signal having a first modulation frequency and amplitude. The method also includes transmitting the first optical signal and a second optical signal from a first location to a sensor location. The method also includes modulating the second optical signal with a second modulation frequency and amplitude, the second modulation frequency and amplitude converted from the first optical signal. The method also includes comparing the first modulation frequency to the second modulation frequency to determine one of a phase difference and a time lag and calculating the electrochemical impedance spectroscopy of the sensor and its immediate surroundings as a function of frequency.


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