The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Oct. 05, 2006
Applicants:

Haizhou Ai, Beijing, CN;

Chang Huang, Beijing, CN;

Yuan LI, Beijing, CN;

Shihong Lao, Kyoto, JP;

Inventors:

Haizhou Ai, Beijing, CN;

Chang Huang, Beijing, CN;

Yuan Li, Beijing, CN;

Shihong Lao, Kyoto, JP;

Assignees:

Omron Corporation, Kyoto, JP;

Tsinghua University, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/70 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and a method for detecting from an image a particular subject corresponding to multiple views of the subject by dividing a particular subject space into a plurality of subject subspaces and further dividing a subject subspace into subject subspaces representing multiple views; configuring a tree-structured detector wherein the tree structure has a root node that covers all subject subspaces and has a plurality of branches, each branch corresponding to a child node that covers at least one subject subspace; training each node to determine which nodes in the adjacent lower layer the images of the subject in the corresponding nodes should be sent.


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