The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Aug. 08, 2006
Takashi Kikukawa, Tokyo, JP;
Narutoshi Fukuzawa, Tokyo, JP;
Tatsuhiro Kobayashi, Tokyo, JP;
Junji Tominaga, Tsukuba, JP;
Takashi Nakano, Tsukuba, JP;
Takayuki Shima, Tsukuba, JP;
Joo-ho Kim, Suwon-si, KR;
In-oh Hwang, Suwon-si, KR;
Takashi Kikukawa, Tokyo, JP;
Narutoshi Fukuzawa, Tokyo, JP;
Tatsuhiro Kobayashi, Tokyo, JP;
Junji Tominaga, Tsukuba, JP;
Takashi Nakano, Tsukuba, JP;
Takayuki Shima, Tsukuba, JP;
Joo-ho Kim, Suwon-si, KR;
In-oh Hwang, Suwon-si, KR;
TDK Corporation, Tokyo, JP;
Abstract
An optical recording medium includes a substrate, a first dielectric layer, a recording layer, a second dielectric layer, a super-resolution layer, and a third dielectric layer, which are provided in that order. The super-resolution layer is formed of a material configured such that voids are generated when the material is irradiated with DC light at a predetermined irradiation power for 1 to 300 seconds. Therefore, super-resolution reproduction can be made such that the irradiation power of a readout laser beam does not depend on the size of a recording mark.