The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Nov. 07, 2008
Bruce Douglas Buch, Westborough, MA (US);
Mathew P. Vea, Shrewsbury, MA (US);
Jon Karsten Klarqvist, Roseville, MN (US);
Bruce Douglas Buch, Westborough, MA (US);
Mathew P. Vea, Shrewsbury, MA (US);
Jon Karsten Klarqvist, Roseville, MN (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
A method and apparatus for measuring latency in a communication path is provided. The technique includes driving a signal such as a square wave on the communication path, such as a write path such that it travels around the write-read path, and sensing a returned signal at one end of the write-read path. A square wave signal corresponding to the square wave driven on the write path is delayed by a predetermined phase thus generating a delayed signal. The returned signal and the delayed signal are mixed, producing a mixed signal. The mixed signal is integrated to obtain an integrated output. The phase by which the delayed signal is shifted is successively adjusted. Returned signals are mixed with such delayed signals until the integrated output is equal to zero. The phase shift amount that results in a nulled integrated output, less a quarter cycle of the square wave, is equal to the round trip latency of the write-read path.