The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Mar. 31, 2008
Toshiyuki Hattori, Hachioji, JP;
Tatsuo Nakata, Hino, JP;
Yasunari Matsukawa, Saitama, JP;
Akinori Araya, Yokohama, JP;
Masaharu Tomioka, Hino, JP;
Toshiyuki Hattori, Hachioji, JP;
Tatsuo Nakata, Hino, JP;
Yasunari Matsukawa, Saitama, JP;
Akinori Araya, Yokohama, JP;
Masaharu Tomioka, Hino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
It is possible to check for observation success or failure and the observation history without waiting for observation to be completely finished, thus saving time and energy required for observation, and avoiding lost opportunities for observation of precious samples etc. Provided is a microscope apparatus including an image acquisition unit for acquiring a plurality of frame images while varying a plurality of parameters; an image saving unit for successively saving the frame images acquired by the image acquisition unit; a property-information saving unit for saving property information in which identifying information of the saved frame images is associated with the parameters; and a control unit for controlling these units, wherein the control unit saves updated property information in the property-information saving unit each time the frame image is saved in the image saving unit.