The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Aug. 03, 2004
Hiroshi Kawasaki, Saitama, JP;
Ryo Furukawa, Hiroshima, JP;
Hiroshi Kawasaki, Saitama, JP;
Ryo Furukawa, Hiroshima, JP;
TechnoDream21 Co., Ltd., Saitama, JP;
Abstract
A three-dimensional shape measuring apparatus includes a line laser light source () and an image capturing device (). A three-dimensional shape measuring method and apparatus is characterized by irradiating a line laser beam to an object () to be measured from a laser projecting device, imaging points () irradiated with the laser beam by the image capturing device (, detecting points on taken images as intersections (), each of the points being detected from the taken images and being detected as a common point where line laser beams pass, deriving equations including the positions of the laser planes and the three-dimensional positions of the intersections as unknowns based on the detected intersections, determining the three-dimensional positions of the intersections and the positions of the laser planes by solving the derived equations as simultaneous equations, calculating by triangulation the three-dimensional positions of the points irradiated with the laser beams other than the intersections by using the positions of laser planes, and obtaining the three-dimensional shape of the object by repeating the series of processes.