The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Sep. 29, 2008
Xiaoming Du, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Tian Chen, Shanghai, CN;
Jianming Zheng, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
James Allen Baird, Amelia, OH (US);
Xinjue Zou, Shanghai, CN;
Xiaoming Du, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Tian Chen, Shanghai, CN;
Jianming Zheng, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
James Allen Baird, Amelia, OH (US);
Xinjue Zou, Shanghai, CN;
General Electric Company, Niskayuna, NY (US);
Abstract
A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile