The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Feb. 03, 2006
Klaus Körner, Schoneiche, DE;
Reinhard Berger, Esslingen, DE;
Ulrich Droste, Berlin, DE;
Christian Kohler, Schwaigern, DE;
Wolfgang Osten, Stuttgart, DE;
Christof Pruss, Gerlingen, DE;
Aiko Ruprecht, Wedel, DE;
Tobias Wiesendanger, Rauenberg, DE;
Klaus Körner, Schoneiche, DE;
Reinhard Berger, Esslingen, DE;
Ulrich Droste, Berlin, DE;
Christian Kohler, Schwaigern, DE;
Wolfgang Osten, Stuttgart, DE;
Christof Pruss, Gerlingen, DE;
Aiko Ruprecht, Wedel, DE;
Tobias Wiesendanger, Rauenberg, DE;
Universitat Stuttgart, , DE;
Abstract
An interferometric confocal method and assembly for terabyte volume optical data memories couples two-beam spectral interferometry to chromatic confocal technology and permits a longitudinal splitting of foci in the memory volume, with the foci having limited diffraction. A spectrometer is located downstream of the interferometer with confocal discrimination in the beam path. A diffractive optical zone lens (DOZE) with a usage of the first diffraction order is introduced into the interferometric beam path to achieve longitudinal chromatic splitting. The interferometer can be a fiber-coupled interferometer with a retroreflector in the fiber-coupled reference arm and with wavelength-dependent optical path difference modification by dispersion or diffraction. The optical path difference in the interferometer is set so that easily detectable wavelets are formed from detectable interferograms by spectral analysis.