The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Dec. 27, 2007
Applicants:

Kazutoshi Tokunaga, Kakogawa, JP;

Norimasa Yamamoto, Kobe, JP;

Inventors:

Kazutoshi Tokunaga, Kakogawa, JP;

Norimasa Yamamoto, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzer is provided with a light irradiation device. The light irradiation device includes a light source, and a rotatable filter section, which has a plurality of optical filters having different light transmission characteristics, and irradiates an analyzing object with light that passed through the optical filters arranged in a path of the light from the light source while the filter section is rotating, by successively switching the optical filters by rotating the filter section. The analyzer is also provided with an analyzing means for analyzing characteristics of the analyzing object, based on optical information obtained from the analyzing object irradiated with the light by the light irradiation device while the filter section is rotating.


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