The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Jul. 17, 2008
Applicant:

Ryoko Tomioka, Saitama, JP;

Inventor:

Ryoko Tomioka, Saitama, JP;

Assignee:

Fujinon Corporation, Saitama-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The evaluating apparatus evaluates a restoration-premised lens which is employed in an image forming system that converts an optical image into an electronic image and then enforces a restoration processing on the electronic image in order to obtain a sharp image, is actually manufactured based on such design as premised on the restoration processing. The evaluating apparatus includes an evaluating corrective optical system, measuring section and evaluating section. The evaluating corrective optical system, when it is combined with a lens manufactured just as designed, forms a sharp optical image. The measuring section measures the optical characteristics of a composite optical system provided by combining together the evaluating corrective optical system and the manufactured lens. The evaluating section evaluates the manufactured lens according to measured results provided by measuring section.


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