The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Mar. 12, 2008
Applicants:

Maziar Sardashti, Bartlesville, OK (US);

Raul J. Barriga, Lake Jackson, TX (US);

David J. Blumer, Bartlesville, OK (US);

Inventors:

Maziar Sardashti, Bartlesville, OK (US);

Raul J. Barriga, Lake Jackson, TX (US);

David J. Blumer, Bartlesville, OK (US);

Assignee:

ConocoPhillips Company, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test cell comprises a test chamber at least partially enclosed by a wall. The test chamber holds a test fluid, and a test material is placed within the test chamber such that at least a portion of the test material is contact with the test fluid and at least a portion of the test material is in optical register with a window of the wall. A first conductive element is in electrical communication with the test fluid but is separated from the test material by a space, and extends to an outside of the cell. A second conductive element is in electrical communication with the test material and also extends to the outside of the cell.


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