The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Oct. 03, 2007
Junichi Aoki, Tokyo, JP;
Junichi Aoki, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
In an image processing apparatus, a defect detection unit detects a defective pixel and a defect level thereof by comparing a maximum pixel value detected at each pixel position of a plurality of images captured via an image taking operation performed a plurality of times by an image sensor with a threshold value for detecting white defective pixels, and/or by comparing a minimum pixel value detected at each pixel position of the plurality of images with a threshold value for detecting black defective pixels. A defective pixel selection unit selects a predetermined plurality of defective pixels with high defect degrees, and registers defect data associated with the predetermined plurality of selected defective pixels in the defect data table. A defect correction unit corrects pixel values of pixels of the image output from the image sensor, in accordance with the defect data registered in the defect data table.