The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Dec. 17, 2008
Applicants:

Kunio Moriyama, Hitachi, JP;

Takahide Nakayama, Nara, JP;

Hideaki Nishiuchi, Hitachinaka, JP;

Inventors:

Kunio Moriyama, Hitachi, JP;

Takahide Nakayama, Nara, JP;

Hideaki Nishiuchi, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A charged particle beam irradiation system comprises a high-speed steerer (beam dump device)disposed in a course of a beam transport linethrough which an ion beam is extracted from a charged-particle beam generator. The beam dump deviceis provided with dose monitoring devicesfor measuring a dose of an ion beam applied to a beam dumpso that the intensity of the ion beam can be measured without transporting the ion beam to irradiation nozzlesA throughD. Thus, the system is capable of adjusting the intensity of an ion beam extracted from a synchrotron without operating each component of a beam transport line, and an irradiation nozzle.


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