The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Aug. 28, 2008
Applicants:

Michael E. Dugas, Londonderry, NH (US);

Mark Hamilton, Upton, MA (US);

Kenneth P. Martin, Watertown, MA (US);

Inventors:

Michael E. Dugas, Londonderry, NH (US);

Mark Hamilton, Upton, MA (US);

Kenneth P. Martin, Watertown, MA (US);

Assignee:

Thermo Niton Analyzers LLC, Billerica, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01N 21/00 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analytical instrument may be docked in a stand. The stand provides electrical power, cooling, gas to purge air from an analytical gap within the instrument and/or other supplies or services to the instrument. The stand contains a contactless memory, such as an RF-ID tag, which stores information about the supplies and/or services the stand is capable of providing to the instrument. The instrument reads the stand's contactless memory and automatically sets operational parameters of the instrument in accordance with the supplies and/or services the stand is capable of providing. Thus, the instrument may automatically operate in an enhanced mode, such as at a higher x-ray beam power, as a result of being mounted in the stand.


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