The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Apr. 18, 2006
Gerhard Forster, Schwarzenbruck, DE;
Jens Hamann, Fürth, DE;
Uwe Ladra, Erlangen, DE;
Claus-günter Schliermann, Kemnath, DE;
Elmar Schäfers, Fürth, DE;
Gerhard Forster, Schwarzenbruck, DE;
Jens Hamann, Fürth, DE;
Uwe Ladra, Erlangen, DE;
Claus-Günter Schliermann, Kemnath, DE;
Elmar Schäfers, Fürth, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
According to the invention, an X-ray examination may be simply and rapidly carried out and hence produce a sharp X-ray image with an X-ray source and/or X-ray receiver an X-ray examination system which may be displaced relative to the mounting position thereof by means of an actuator, despite a system construction which may be caused to oscillate at a resonant frequency dependent on the corresponding mounting position, about the mounting position, whereby according to the inventive method, at least one parameter relevant to the resonant frequency, dependent on the corresponding mounting position, is determined, a set guided movement, counteracting the cause of oscillation in order to achieve a movement condition for the X-ray source or X-ray receiver necessary for the X-ray examination, is determined depending on the at least one corresponding parameter and the guided movement of the X-ray source and/or X-ray receiver controlled using the actuator according to the set guided movement.