The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2011

Filed:

Sep. 01, 2006
Applicant:

Yoshinobu Hosoi, Gamogori, JP;

Inventor:

Yoshinobu Hosoi, Gamogori, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A subjective vision tester includes a pair of right and left lens chamber units () each having a test window (), a first lens disk (-) provided with an aperture and a plurality of optical elements () and placed in a position closer to an examinee's eye (E) within the each lens chamber unit, and a second lens disk () provided with an aperture () and a plurality of optical elements () and placed in a position farther from the examinee's eye than the first lens disk within the lens chamber unit. The first lens disk and the second lens disk are equal in diameter. The diameter of the diameter of the aperture in the second lens disk is larger than each optical element in the first lens disk.


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