The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Nov. 19, 2007
Huihao Xu, Brooklyn, NY (US);
Louis L. Hsu, Fishkill, NY (US);
Kevin G. Kramer, Wappingers Falls, NY (US);
James D. Rockrohr, Hopewell Junction, NY (US);
Michael A. Sorna, Hopwell Junction, NY (US);
Huihao Xu, Brooklyn, NY (US);
Louis L. Hsu, Fishkill, NY (US);
Kevin G. Kramer, Wappingers Falls, NY (US);
James D. Rockrohr, Hopewell Junction, NY (US);
Michael A. Sorna, Hopwell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A design structure embodied in a machine-readable medium used in a design process may include a system for detecting a fault in a signal transmission path. Such system may include, for example, a hysteresis comparator including a latch having n-type field effect transistor ('NFET') storage elements. The hysteresis comparator may be operable to detect a crossing of a reference voltage level by an input signal arriving from the signal transmission path such that when the comparator does not detect an expected crossing of the reference voltage level by the input signal, the fault is determined to be detected in the signal transmission path.