The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7873861 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 18, 2011

Filed:

Jun. 27, 2008
Applicants:

Benjiman Lee Goodman, Cedar Park, TX (US);

Paul Frank Lecocq, Cedar Park, TX (US);

Praveen S. Reddy, Austin, TX (US);

Inventors:

Benjiman Lee Goodman, Cedar Park, TX (US);

Paul Frank Lecocq, Cedar Park, TX (US);

Praveen S. Reddy, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus, and program for systematically testing the functionality of all connections in a multi-tiered bus system that connects a large number of processors. Each bus controller is instructed to send a test version of a snoop request to all of the other processors and to wait for the replies. If a connection is bad, the port associated with that connection will time out. Detection of a time-out will cause the initialization process to be halted until the problem can be isolated and resolved.


Find Patent Forward Citations

Goodman, Benjiman. (2011). Apparatus to use fabric initialization to test functionality of all inter-chip paths between processors in system (U.S. Patent No. 7873861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7873861

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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