The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Dec. 29, 2003
Applicant:
Jeff Scott Eder, Mill Creek, WA (US);
Inventor:
Jeff Scott Eder, Mill Creek, WA (US);
Assignee:
Asset Trust, Inc., Bothell, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 40/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of and system for transforming data from a plurality of systems into models of each of the segments of organization value and using said models to support the analysis, measurement and optimization of one or more aspects of organization risk and value.
Quick Actions:
Eder, Jeff. (2011). Value and risk management system (U.S. Patent No. 7873567). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7873567
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