The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2011

Filed:

Mar. 29, 2007
Applicants:

Devesh Mishra, Issaquah, WA (US);

Mackenzie Smith, Issaquah, WA (US);

Hong Tian, Seattle, WA (US);

Felix F. Antony, Issaquah, WA (US);

Inventors:

Devesh Mishra, Issaquah, WA (US);

Mackenzie Smith, Issaquah, WA (US);

Hong Tian, Seattle, WA (US);

Felix F. Antony, Issaquah, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method for automatically correcting item dimension values may facilitate operations of a materials handling facility. Such a method may include recommending a container for handling one or more items dependent on currently stored item dimension values and determining if any of the item values are inaccurate dependent on an actual container used to handle the one or more items. In some embodiments, the method may include calculating a volumetric utilization of an actual and a recommended container and comparing the two utilizations to determine if the recommended container was too large or too small. If the recommended container was too large or too small, the method may include flagging one or more of the items for measurement and/or correcting item dimensions for one or more of the items. Items may be flagged for measurement in response to a single mismatch between recommended and actual containers or multiple mismatches.


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