The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Nov. 10, 2006
Dieter Hentschel, Dresden, DE;
Constanze Tschoepe, Dresden, DE;
Ruediger Hoffmann, Dresden, DE;
Matthias Eichner, Berlin, DE;
Matthias Wolff, Goerlitz, DE;
Dieter Hentschel, Dresden, DE;
Constanze Tschoepe, Dresden, DE;
Ruediger Hoffmann, Dresden, DE;
Matthias Eichner, Berlin, DE;
Matthias Wolff, Goerlitz, DE;
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V., Munich, DE;
Technische Universitaet Dresden, Dresden, DE;
Abstract
A device for assessing a quality class of an object to be tested includes a unit for detecting a test signal from the object to be tested. Furthermore, the device for assessing includes a unit for providing a stochastic Markov model including states and transitions between states on the basis of reference measurements of objects of known quality classes, and a unit for evaluating the test signal using the stochastic Markov model. In addition, the device for assessing includes a unit for associating the object to be tested with a quality class based on the evaluation of the test signal. Such a device has the advantage to be able to perform a more precise association of an object to be tested with a quality class as compared to prior art.