The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2011

Filed:

Oct. 07, 2009
Applicants:

Yueping Zeng, Lutz, FL (US);

Jeffrey Kirkland, Redington Beach, FL (US);

John F. Anderson, Oldsmar, FL (US);

Lawrence J. Leftin, Satellite Beach, FL (US);

Richard W. Briske, Kenneth City, FL (US);

Inventors:

Yueping Zeng, Lutz, FL (US);

Jeffrey Kirkland, Redington Beach, FL (US);

John F. Anderson, Oldsmar, FL (US);

Lawrence J. Leftin, Satellite Beach, FL (US);

Richard W. Briske, Kenneth City, FL (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for implementing an iterated extended Kalman filter within a navigation system are provided. In one embodiment, a Kalman filter programmed with time updating error states and measurement updating error states relating to received data sets is provided. The said Kalman filter configured to: iterate both the time updating error states and the measurement updating error states based on a first criteria; and iterate only the measurement updating error states based on a second criteria.


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