The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Dec. 15, 2006
Applicants:
Michael W. Haney, Oak Hill, VA (US);
Michael J. Mcfadden, McLean, VA (US);
Muzammil Iqbal, San Diego, CA (US);
Inventors:
Michael W. Haney, Oak Hill, VA (US);
Michael J. McFadden, McLean, VA (US);
Muzammil Iqbal, San Diego, CA (US);
Assignee:
University of Delaware, Newark, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2006.01); H04B 10/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for achieving high-density and misalignment tolerant short-reach free-space optical interconnects between arbitrary locations in a field, using microlenses, steering elements and a curved reflecting surface.
Haney, Michael. (2011). Method and apparatus for free-space optical interconnects between arbitrary locations in a field using lenses, steering elements and a curved reflecting surface (U.S. Patent No. 7873280). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7873280
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile