The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Apr. 20, 2005
Applicant:
Mitsuru Uzawa, Tokyo, JP;
Inventor:
Mitsuru Uzawa, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01); G06K 9/46 (2006.01); G06K 9/48 (2006.01); G06K 9/66 (2006.01); G06K 9/40 (2006.01); G06K 15/00 (2006.01); G06T 11/20 (2006.01); H04N 1/40 (2006.01); H04N 1/403 (2006.01); H04N 1/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
A function approximation processing method comprises inputting and binarizing image data, extracting contour from the binarized image data, estimating tangent points in horizontal and vertical directions from the contour, and approximating contour between adjacent tangent points among the estimated tangent points with a predetermined function, thereby an input object such as a character or a figure can be processed at high speed, and outline data with high image quality can be generated with a reduced number of points.